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Selected technological aspects of semiconductor samples preparation for Hall effect measurements
- Source :
- Proceedings of SPIE; August 2018, Vol. 10830 Issue: 1 p108300V-108300V-5, 974706p
- Publication Year :
- 2018
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 10830
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs46366080
- Full Text :
- https://doi.org/10.1117/12.2503639