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Towards an x-ray-based coded aperture diffraction system for bulk material identification

Authors :
Ashok, Amit
Greenberg, Joel A.
Gehm, Michael E.
Neifeld, Mark A.
Diallo, S. O.
Tadlock, K.
Gregory, C.
Wolter, S.
Greenberg, J. A.
Roe, K.
Source :
Proceedings of SPIE; April 2018, Vol. 10632 Issue: 1 p1063209-1063209-16
Publication Year :
2018

Details

Language :
English
ISSN :
0277786X
Volume :
10632
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs45969584
Full Text :
https://doi.org/10.1117/12.2302513