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Large (GeTe):(Sb2Te3) ratio phase change memory thin films

Authors :
Taccheo, Stefano
Mackenzie, Jacob I.
Ferrari, Maurizio
Bouska, M.
Pechev, S.
Simon, Q.
Nazabal, V.
Gutwirth, J.
Nemec, P.
Source :
Proceedings of SPIE; May 2018, Vol. 10683 Issue: 1 p106830A-106830A-7, 961478p
Publication Year :
2018

Details

Language :
English
ISSN :
0277786X
Volume :
10683
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs45968370
Full Text :
https://doi.org/10.1117/12.2306503