Back to Search Start Over

A deep learning framework for the automated inspection of complex dual-energy x-ray cargo imagery

Authors :
Ashok, Amit
Franco, Edward D.
Gehm, Michael E.
Neifeld, Mark A.
Rogers, Thomas W.
Jaccard, Nicolas
Griffin, Lewis D.
Source :
Proceedings of SPIE; May 2017, Vol. 10187 Issue: 1 p101870L-101870L-12, 10085143p
Publication Year :
2017

Details

Language :
English
ISSN :
0277786X
Volume :
10187
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs42662833
Full Text :
https://doi.org/10.1117/12.2262662