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Representation-learning for anomaly detection in complex x-ray cargo imagery

Authors :
Ashok, Amit
Franco, Edward D.
Gehm, Michael E.
Neifeld, Mark A.
Andrews, Jerone T. A.
Jaccard, Nicolas
Rogers, Thomas W.
Griffin, Lewis D.
Source :
Proceedings of SPIE; May 2017, Vol. 10187 Issue: 1 p101870E-101870E-11, 10085142p
Publication Year :
2017

Details

Language :
English
ISSN :
0277786X
Volume :
10187
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs42662825
Full Text :
https://doi.org/10.1117/12.2261101