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Determination of diffusion length of electron beam induced minority carriers in polycrystalline GaAs

Authors :
Paz, O.
Borrego, J. M.
Source :
Applied Physics Letters; June 1983, Vol. 42 Issue: 11 p958-960, 3p
Publication Year :
1983

Details

Language :
English
ISSN :
00036951 and 10773118
Volume :
42
Issue :
11
Database :
Supplemental Index
Journal :
Applied Physics Letters
Publication Type :
Periodical
Accession number :
ejs41975947
Full Text :
https://doi.org/10.1063/1.93813