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50−nm silicon structures fabricated with trilevel electron beam resist and reactive‐ion etching

Authors :
Jackel, L. D.
Howard, R. E.
Hu, E. L.
Tennant, D. M.
Grabbe, P.
Source :
Applied Physics Letters; August 1981, Vol. 39 Issue: 3 p268-270, 3p
Publication Year :
1981

Details

Language :
English
ISSN :
00036951 and 10773118
Volume :
39
Issue :
3
Database :
Supplemental Index
Journal :
Applied Physics Letters
Publication Type :
Periodical
Accession number :
ejs41974157
Full Text :
https://doi.org/10.1063/1.92668