Back to Search
Start Over
Tunnel junction 850-nm VCSEL for aperture uniformity and reliability
- Source :
- Proceedings of SPIE; February 2017, Vol. 10122 Issue: 1 p101220B-101220B-5, 910986p
- Publication Year :
- 2017
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 10122
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs41636101
- Full Text :
- https://doi.org/10.1117/12.2253053