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Modeling the impact of process and operation variations on the soft error rate of digital circuits

Authors :
Song, Ruiqiang
Chen, Shuming
Liang, Bin
Chi, Yaqing
Chen, Jianjun
Source :
SCIENCE CHINA Information Sciences; December 2017, Vol. 60 Issue: 12 p1-3, 3p
Publication Year :
2017

Details

Language :
English
ISSN :
1674733X and 18691919
Volume :
60
Issue :
12
Database :
Supplemental Index
Journal :
SCIENCE CHINA Information Sciences
Publication Type :
Periodical
Accession number :
ejs41429769
Full Text :
https://doi.org/10.1007/s11432-016-9001-9