Back to Search Start Over

In-process measuring procedure for sub-100?nm structures

Authors :
Zimmermann, M.
Tausendfreund, A.
Patzelt, S.
Goch, G.
Kieß, S.
Shaikh, M. Z.
Gregoire, M.
Simon, S.
Source :
Journal of Laser Applications; September 2012, Vol. 24 Issue: 4 p042010-42015, 6p
Publication Year :
2012

Details

Language :
English
ISSN :
1042346X
Volume :
24
Issue :
4
Database :
Supplemental Index
Journal :
Journal of Laser Applications
Publication Type :
Periodical
Accession number :
ejs41236434
Full Text :
https://doi.org/10.2351/1.4719936