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Defect inspection and printability study for 14 nm node and beyond photomask
- Source :
- Proceedings of SPIE; October 2016, Vol. 9985 Issue: 1 p99851Y-99851Y-8, 898668p
- Publication Year :
- 2016
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 9985
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs40743186
- Full Text :
- https://doi.org/10.1117/12.2243514