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Scanning coherent scattering methods for actinic EUV mask inspection

Authors :
Kasprowicz, Bryan S.
Buck, Peter D.
Ekinci, Y.
Helfenstein, P.
Rajeev, R.
Mochi, I.
Mohacsi, I.
Gobrecht, J.
Yoshitake, S.
Source :
Proceedings of SPIE; October 2016, Vol. 9985 Issue: 1 p99851P-99851P-9, 898669p
Publication Year :
2016

Details

Language :
English
ISSN :
0277786X
Volume :
9985
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs40743179
Full Text :
https://doi.org/10.1117/12.2242961