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D-49 Recent Development of Hard X-ray Transmission Microscopy at the 32ID Beamline at the APS

Authors :
Yi, J. M.
Lee, W. -K.
De Carlo, F.
Chu, Y. S.
Yun, W.
Hwu, Y.
Source :
Powder Diffraction; June 2009, Vol. 24 Issue: 2 p169-169, 1p
Publication Year :
2009

Details

Language :
English
ISSN :
08857156 and 19457413
Volume :
24
Issue :
2
Database :
Supplemental Index
Journal :
Powder Diffraction
Publication Type :
Periodical
Accession number :
ejs40720115
Full Text :
https://doi.org/10.1154/1.3175970