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A detailed investigation of strain patterning effect on bilayer InAs/GaAs quantum dot with varying GaAs barrier thickness

Authors :
Huffaker, Diana L.
Eisele, Holger
Dick, Kimberly A.
Tongbram, B.
Sehara, N.
Singhal, J.
Panda, D. P.
Chakrabarti, S.
Source :
Proceedings of SPIE; March 2016, Vol. 9758 Issue: 1 p975802-975802-9
Publication Year :
2016

Details

Language :
English
ISSN :
0277786X
Volume :
9758
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs39834786
Full Text :
https://doi.org/10.1117/12.2212767