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Tackling the x-ray cargo inspection challenge using machine learning

Authors :
Ashok, Amit
Neifeld, Mark A.
Gehm, Michael E.
Jaccard, Nicolas
Rogers, Thomas W.
Morton, Edward J.
Griffin, Lewis D.
Source :
Proceedings of SPIE; May 2016, Vol. 9847 Issue: 1 p98470N-98470N-13, 9748544p
Publication Year :
2016

Details

Language :
English
ISSN :
0277786X
Volume :
9847
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs39675133
Full Text :
https://doi.org/10.1117/12.2222765