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Measurement of flaw size from thermographic data

Authors :
Hsieh, Sheng-Jen (Tony)
Zalameda, Joseph N.
Winfree, William P.
Zalameda, Joseph N.
Howell, Patricia A.
Source :
Proceedings of SPIE; June 2015, Vol. 9485 Issue: 1 p94850D-94850D-11, 9390162p
Publication Year :
2015

Details

Language :
English
ISSN :
0277786X
Volume :
9485
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs36198738
Full Text :
https://doi.org/10.1117/12.2176292