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Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation

Authors :
Zehetbauer, M.
Ungar, T.
Kral, R.
Borbely, A.
Schafler, E.
Ortner, B.
Amenitsch, H.
Bernstorff, S.
Source :
Acta Materialia; 1999, Vol. 47 Issue: 3 p1053-1062, 10p
Publication Year :
1999

Details

Language :
English
ISSN :
13596454
Volume :
47
Issue :
3
Database :
Supplemental Index
Journal :
Acta Materialia
Publication Type :
Periodical
Accession number :
ejs3589520
Full Text :
https://doi.org/10.1016/S1359-6454(98)00366-8