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A methodology to optimize design pattern context size for higher sensitivity to hotspot detection using pattern association tree (PAT)

Authors :
Sturtevant, John L.
Capodieci, Luigi
Somani, Shikha
Pathak, Piyush
Verma, Piyush
Madhavan, Sriram
Capodieci, Luigi
Source :
Proceedings of SPIE; March 2015, Vol. 9427 Issue: 1 p94270T-94270T-13, 9332744p
Publication Year :
2015

Details

Language :
English
ISSN :
0277786X
Volume :
9427
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs35679857
Full Text :
https://doi.org/10.1117/12.2086954