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Atomic resolution with a new atomic force tip

Authors :
Pitsch, M.
Metz, O.
Kohler, H.-H.
Heckmann, K.
Strnad, J.
Source :
Thin Solid Films; August 1989, Vol. 175 Issue: 1 p81-84, 4p
Publication Year :
1989

Abstract

Using a new type of tip, atomic resolution of nonconducting as well as conducting surfaces is possible in a conventional scanning tunnelling microscopy experimental set-up. Images of atomic corrugations of highly oriented pytolitic graphite are presented.

Details

Language :
English
ISSN :
00406090
Volume :
175
Issue :
1
Database :
Supplemental Index
Journal :
Thin Solid Films
Publication Type :
Periodical
Accession number :
ejs34390616
Full Text :
https://doi.org/10.1016/0040-6090(89)90812-2