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Refractive index and thickness determination of monolayers by multi mode waveguide coupled surface plasmons

Authors :
Weisser, M.
Menges, B.
Mittler-Neher, S.
Source :
Sensors and Actuators B: Chemical; 1999, Vol. 56 Issue: 3 p189-197, 9p
Publication Year :
1999

Details

Language :
English
ISSN :
09254005
Volume :
56
Issue :
3
Database :
Supplemental Index
Journal :
Sensors and Actuators B: Chemical
Publication Type :
Periodical
Accession number :
ejs3438415
Full Text :
https://doi.org/10.1016/S0925-4005(99)00034-9