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Spectroscopy and microscopy of localised and delocalised excitons in InGaN-based light emitting diodes and epilayers

Authors :
O'Donnell, K.P.
Martin, R.W.
Middleton, P.G.
Bayliss, S.C.
Fletcher, I.
Stricht, W. Van der
Demeester, P.
Moerman, I.
Source :
Materials Science and Engineering B: Solid-State Materials for Advanced Technology; 1999, Vol. 59 Issue: 1 p288-291, 4p
Publication Year :
1999

Details

Language :
English
ISSN :
09215107
Volume :
59
Issue :
1
Database :
Supplemental Index
Journal :
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
Publication Type :
Periodical
Accession number :
ejs3415558
Full Text :
https://doi.org/10.1016/S0921-5107(98)00343-2
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