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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM
- Source :
- Physica B: Condensed Matter; 2001, Vol. 308 Issue: 1 p294-297, 4p
- Publication Year :
- 2001
Details
- Language :
- English
- ISSN :
- 09214526
- Volume :
- 308
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Physica B: Condensed Matter
- Publication Type :
- Periodical
- Accession number :
- ejs3396340
- Full Text :
- https://doi.org/10.1016/S0921-4526(01)00801-8