Structural investigations of sputter deposited thin films: reflection mode EXAFS, specular and non specular X-ray scattering

Details

Language :

English

ISSN :

09214526

Volume :

283

Issue :

1

Database :

Supplemental Index

Journal :

Physica B: Condensed Matter

Publication Type :

Periodical

Accession number :

ejs3393929

Full Text :

https://doi.org/10.1016/S0921-4526(99)01901-8