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Carrier sign reversal in amorphous silicon ruthenium thin films deposited by co-sputtering
- Source :
- Proceedings of SPIE; December 2013, Vol. 9068 Issue: 1 p90680D-90680D-5, 816126p
- Publication Year :
- 2013
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 9068
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs31739091
- Full Text :
- https://doi.org/10.1117/12.2052223