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Optical microscope combined with the nanopipette-based quartz tuning fork-atomic force microscope for nanolithography

Authors :
Campo, Eva M.
Dobisz, Elizabeth A.
Eldada, Louay A.
An, Sangmin
Stambaugh, Corey
Kwon, Soyoung
Lee, Kunyoung
Kim, Bongsu
Kim, Qwhan
Jhe, Wonho
Source :
Proceedings of SPIE; September 2013, Vol. 8816 Issue: 1 p881608-881608-6
Publication Year :
2013

Details

Language :
English
ISSN :
0277786X
Volume :
8816
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs31223275
Full Text :
https://doi.org/10.1117/12.2036779