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Investigation on the dielectric behavior of aluminum nitride thin films at different temperatures applying a time-zero approach
- Source :
- Proceedings of SPIE; May 2013, Vol. 8763 Issue: 1 p87631X-87631X-7, 788687p
- Publication Year :
- 2013
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 8763
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs31094342
- Full Text :
- https://doi.org/10.1117/12.2017066