Robustness of antenna-coupled distributed bolometers

This Letter shows the effect of the geometrical and material properties of lead lines and connections on the robustness and reliability of optical antennas working as distributed bolometers. We analyze the operational limits of the biasing voltage using a mutiphysics finite element method. We demonstrate that, after evaluating the effect of the electromagnetic irradiance falling on the device, biasing voltage is the main limiting factor to maintain operative titanium optical antennas. Results have been experimentally verified by finding the biasing values needed to destroy optical antennas working as distributed bolometers. Structural damage has been identified from scanning electron microscopy images.