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Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors

Authors :
Voldman, S. H.
Gerosa, G.
Gross, V. P.
Dickson, N.
Furkay, S.
Slinkman, J.
Source :
Journal of Electrostatics; 1996, Vol. 38 Issue: 1 p3-32, 30p
Publication Year :
1996

Details

Language :
English
ISSN :
03043886
Volume :
38
Issue :
1
Database :
Supplemental Index
Journal :
Journal of Electrostatics
Publication Type :
Periodical
Accession number :
ejs3102587
Full Text :
https://doi.org/10.1016/S0304-3886(96)00014-9