Film thickness dependence on the electrical and optical properties of PtSi/p-Si(1 0 0) Schottky barrier detector

Details

Language :

English

ISSN :

02540584

Volume :

74

Issue :

2

Database :

Supplemental Index

Journal :

Materials Chemistry and Physics

Publication Type :

Periodical

Accession number :

ejs3027642

Full Text :

https://doi.org/10.1016/S0254-0584(01)00464-3