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Reductant-Assisted Self-Assembly with Cu/Sn Microbump for Three-Dimensional Heterogeneous Integration

Authors :
Ito, Yuka
Fukushima, Takafumi
Lee, Kang-Wook
Choki, Koji
Tanaka, Tetsu
Koyanagi, Mitsumasa
Source :
Japanese Journal of Applied Physics; April 2013, Vol. 52 Issue: 4 p04CB09-04CB06
Publication Year :
2013

Abstract

To establish liquid-assisted assembly processes applicable to heterogeneous system integrations, we present flip-chip self-assembly of dies with Cu/Sn microbumps using the difference in droplet wetting between hydrophilic and hydrophobic areas. Flip-chip self-assembly is assisted by a water-soluble flux that has high surface tension comparable to that of pure water and contains an additive of a reducing agent for metal oxides. Control of the additive concentration in the flux provides high wettability contrast that enable spontaneous and precise alignment of chips to hydrophilic areas formed on substrates within 5 μm in alignment accuracy. In the subsequent chip bonding process, the reductant can eliminate the metal oxide layer and improve the solder wettability of Sn to the corresponding electrode pads formed on the chips. In addition, we confirm, through electrical characteristic evaluation after thermal compression bonding, that the resulting daisy chain formed between the substrates and self-assembled chips with the flux shows sufficiently low contact resistance of below 20 m$\Omega$/bump without disconnection.

Details

Language :
English
ISSN :
00214922 and 13474065
Volume :
52
Issue :
4
Database :
Supplemental Index
Journal :
Japanese Journal of Applied Physics
Publication Type :
Periodical
Accession number :
ejs30152086
Full Text :
https://doi.org/10.7567/JJAP.52.04CB09