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Combined electron and ion projection microscopy

Authors :
Schmid, H.
Fink, H.-W.
Source :
Applied Surface Science; 1993, Vol. 67 Issue: 1-4 p436-436, 1p
Publication Year :
1993

Details

Language :
English
ISSN :
01694332
Volume :
67
Issue :
1-4
Database :
Supplemental Index
Journal :
Applied Surface Science
Publication Type :
Periodical
Accession number :
ejs2992561
Full Text :
https://doi.org/10.1016/0169-4332(93)90350-K