Back to Search Start Over

Using the metal-oxide-polysilicon-silicon (MOPS) structure to determine LPCVD polysilicon quality

Authors :
Carter, J. C.
Evans, A. G. R.
Throngnumchai, K.
Source :
Applied Surface Science; 1993, Vol. 63 Issue: 1 p281-281, 1p
Publication Year :
1993

Details

Language :
English
ISSN :
01694332
Volume :
63
Issue :
1
Database :
Supplemental Index
Journal :
Applied Surface Science
Publication Type :
Periodical
Accession number :
ejs2992347
Full Text :
https://doi.org/10.1016/0169-4332(93)90107-M