Diagnostics of Si multi-d-doped GaAs layers by Raman spectroscopy on bevelled structures

Details

Language :

English

ISSN :

01694332

Volume :

183

Issue :

1

Database :

Supplemental Index

Journal :

Applied Surface Science

Publication Type :

Periodical

Accession number :

ejs2991985

Full Text :

https://doi.org/10.1016/S0169-4332(01)00575-X