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Dispersion-compensating scanning X-ray spectrometer for Compton profile measurements
- Source :
- Nuclear Instruments and Methods in Physics Research Section A; 2001, Vol. 467 Issue: 2 p1541-1544, 4p
- Publication Year :
- 2001
Details
- Language :
- English
- ISSN :
- 01689002
- Volume :
- 467
- Issue :
- 2
- Database :
- Supplemental Index
- Journal :
- Nuclear Instruments and Methods in Physics Research Section A
- Publication Type :
- Periodical
- Accession number :
- ejs2974919
- Full Text :
- https://doi.org/10.1016/S0168-9002(01)00754-9