Characterization of an ONO-stacked insulator film for a silicon micro-strip detector

Details

Language :

English

ISSN :

01689002

Volume :

385

Issue :

2

Database :

Supplemental Index

Journal :

Nuclear Instruments and Methods in Physics Research Section A

Publication Type :

Periodical

Accession number :

ejs2968710

Full Text :

https://doi.org/10.1016/S0168-9002(96)01145-X