An approximate formula for the angular dependence of the residual defect in a silicon surface barrier detector

Details

Language :

English

ISSN :

01689002

Volume :

363

Issue :

3

Database :

Supplemental Index

Journal :

Nuclear Instruments and Methods in Physics Research Section A

Publication Type :

Periodical

Accession number :

ejs2966840

Full Text :

https://doi.org/10.1016/0168-9002(95)00445-9