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Radiation effect on n-MOSFETs fabricated in a BiCMOS process

Authors :
Ohyama, H.
Simoen, E.
Claeys, C.
Nakabayashi, M.
Hayama, K.
Ueda, A.
Kobayashi, K.
Takami, Y.
Source :
Nuclear Instruments and Methods in Physics Research Section B; 2002, Vol. 186 Issue: 1 p419-423, 5p
Publication Year :
2002

Details

Language :
English
ISSN :
0168583X
Volume :
186
Issue :
1
Database :
Supplemental Index
Journal :
Nuclear Instruments and Methods in Physics Research Section B
Publication Type :
Periodical
Accession number :
ejs2950968
Full Text :
https://doi.org/10.1016/S0168-583X(01)00861-8