Back to Search Start Over

High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si - Part III: heavy-fluence Co bombardment induced surface topography development

Authors :
Zhang, Y.
Winzell, T.
Zhang, T.
Maximov, I.A.
Sarwe, E.-L.
Graczyk, M.
Montelius, L.
Whitlow, H.J.
Source :
Nuclear Instruments and Methods in Physics Research Section B; 1999, Vol. 159 Issue: 3 p158-165, 8p
Publication Year :
1999

Details

Language :
English
ISSN :
0168583X
Volume :
159
Issue :
3
Database :
Supplemental Index
Journal :
Nuclear Instruments and Methods in Physics Research Section B
Publication Type :
Periodical
Accession number :
ejs2949182
Full Text :
https://doi.org/10.1016/S0168-583X(99)00539-X