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Dual-energy technique for rapid, high-sensitivity PIXE analysis of aerosol samples covering elements with atomic numbers down to Z = 13

Authors :
Hietel, B.
Schulz, F.
Menzel, N.
Tschiersch, J.
Busch, B.
Wittmaack, K.
Source :
Nuclear Instruments and Methods in Physics Research Section B; 1996, Vol. 109 Issue: 1 p498-501, 4p
Publication Year :
1996

Details

Language :
English
ISSN :
0168583X
Volume :
109
Issue :
1
Database :
Supplemental Index
Journal :
Nuclear Instruments and Methods in Physics Research Section B
Publication Type :
Periodical
Accession number :
ejs2944838
Full Text :
https://doi.org/10.1016/0168-583X(95)00958-2