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Resonant excitation of interfacial Si-O: possibility of nonthermal processing

Authors :
Diener, J.
Kovalev, D.
Koch, F.
Source :
Microelectronic Engineering; 2001, Vol. 59 Issue: 1 p291-294, 4p
Publication Year :
2001

Details

Language :
English
ISSN :
01679317
Volume :
59
Issue :
1
Database :
Supplemental Index
Journal :
Microelectronic Engineering
Publication Type :
Periodical
Accession number :
ejs2932658
Full Text :
https://doi.org/10.1016/S0167-9317(01)00612-8