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Interface roughness of InAs/AlGaAsSb deep quantum well investigated by X-ray reflectivity
- Source :
- Microelectronic Engineering; 1998, Vol. 43 Issue: 1 p185-190, 6p
- Publication Year :
- 1998
Details
- Language :
- English
- ISSN :
- 01679317
- Volume :
- 43
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Microelectronic Engineering
- Publication Type :
- Periodical
- Accession number :
- ejs2931681
- Full Text :
- https://doi.org/10.1016/S0167-9317(98)00162-2