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PECVD of silicon oxynitride for copper metallization systems

Authors :
Vogt, M.
Kachel, M.
Melzer, K.
Drescher, K.
Source :
Microelectronic Engineering; 1996, Vol. 33 Issue: 1 p349-356, 8p
Publication Year :
1996

Details

Language :
English
ISSN :
01679317
Volume :
33
Issue :
1
Database :
Supplemental Index
Journal :
Microelectronic Engineering
Publication Type :
Periodical
Accession number :
ejs2931089
Full Text :
https://doi.org/10.1016/S0167-9317(96)00064-0