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Comparative Study of Low Temperature Polycrystalline Silicon Thin-Film Transistors Obtained by Various Crystallization Techniques for use in Active Matrix LCDs
- Source :
- Microelectronic Engineering; 1992, Vol. 19 Issue: 1 p97-97, 1p
- Publication Year :
- 1992
Details
- Language :
- English
- ISSN :
- 01679317
- Volume :
- 19
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Microelectronic Engineering
- Publication Type :
- Periodical
- Accession number :
- ejs2930294
- Full Text :
- https://doi.org/10.1016/0167-9317(92)90400-L