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On-line testing for VLSI: state of the art and trends
- Source :
- Integration : the VLSI Journal; 1998, Vol. 26 Issue: 1 p197-209, 13p
- Publication Year :
- 1998
Details
- Language :
- English
- ISSN :
- 01679260
- Volume :
- 26
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Integration : the VLSI Journal
- Publication Type :
- Periodical
- Accession number :
- ejs2930061
- Full Text :
- https://doi.org/10.1016/S0167-9260(98)00028-5