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On-line testing for VLSI: state of the art and trends

Authors :
Nicolaidis, M.
Source :
Integration : the VLSI Journal; 1998, Vol. 26 Issue: 1 p197-209, 13p
Publication Year :
1998

Details

Language :
English
ISSN :
01679260
Volume :
26
Issue :
1
Database :
Supplemental Index
Journal :
Integration : the VLSI Journal
Publication Type :
Periodical
Accession number :
ejs2930061
Full Text :
https://doi.org/10.1016/S0167-9260(98)00028-5