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Preliminary characterization of PbI2 polycrystalline layers deposited from solution for nuclear detector applications

Authors :
Ponpon, J. P.
Amann, M.
Source :
Thin Solid Films; 2001, Vol. 394 Issue: 1 p276-282, 7p
Publication Year :
2001

Details

Language :
English
ISSN :
00406090
Volume :
394
Issue :
1
Database :
Supplemental Index
Journal :
Thin Solid Films
Publication Type :
Periodical
Accession number :
ejs2749624
Full Text :
https://doi.org/10.1016/S0040-6090(01)01151-8