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Spectroscopic ellipsometry investigation of V2O5 nanocrystalline thin films
- Source :
- Thin Solid Films; 2001, Vol. 384 Issue: 1 p58-64, 7p
- Publication Year :
- 2001
Details
- Language :
- English
- ISSN :
- 00406090
- Volume :
- 384
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Thin Solid Films
- Publication Type :
- Periodical
- Accession number :
- ejs2749072
- Full Text :
- https://doi.org/10.1016/S0040-6090(00)01820-4