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The effects of growth temperature on the microstructure and electrical barrier height in PtSi/p-Si(100) Schottky barrier detector

The effects of growth temperature on the microstructure and electrical barrier height in PtSi/p-Si(100) Schottky barrier detector

Authors :
Horng, G. J.
Chang, C. Y.
Ho, C.
Lee, C. Y.
Huang, T. Y.
Source :
Thin Solid Films; 2000, Vol. 374 Issue: 1 p80-84, 5p
Publication Year :
2000

Details

Language :
English
ISSN :
00406090
Volume :
374
Issue :
1
Database :
Supplemental Index
Journal :
Thin Solid Films
Publication Type :
Periodical
Accession number :
ejs2748488
Full Text :
https://doi.org/10.1016/S0040-6090(00)01063-4