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The effects of growth temperature on the microstructure and electrical barrier height in PtSi/p-Si(100) Schottky barrier detector
The effects of growth temperature on the microstructure and electrical barrier height in PtSi/p-Si(100) Schottky barrier detector
- Source :
- Thin Solid Films; 2000, Vol. 374 Issue: 1 p80-84, 5p
- Publication Year :
- 2000
Details
- Language :
- English
- ISSN :
- 00406090
- Volume :
- 374
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Thin Solid Films
- Publication Type :
- Periodical
- Accession number :
- ejs2748488
- Full Text :
- https://doi.org/10.1016/S0040-6090(00)01063-4