Atomic force microscopy study of titanium dioxide thin films grown by atomic layer epitaxy

Details

Language :

English

ISSN :

00406090

Volume :

228

Issue :

1

Database :

Supplemental Index

Journal :

Thin Solid Films

Publication Type :

Periodical

Accession number :

ejs2740916

Full Text :

https://doi.org/10.1016/0040-6090(93)90557-6