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Based on the Deep Hole Processing System Resonance Test Design of the Device

Authors :
Shu, Liu Yan
Feng, Liu Zhan
Source :
Advanced Materials Research; April 2012, Vol. 503 Issue: 1 p1041-1044, 4p
Publication Year :
2012

Abstract

Deep hole processing system resonance test devices can accurately and quickly find the whole system resonance frequency, for use of negative pressure device system to processing components provided a convenient, makes the precision of parts is further improved.

Details

Language :
English
ISSN :
10226680
Volume :
503
Issue :
1
Database :
Supplemental Index
Journal :
Advanced Materials Research
Publication Type :
Periodical
Accession number :
ejs27386104
Full Text :
https://doi.org/10.4028/www.scientific.net/AMR.503-504.1041