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STM atomic-scale characterization of the @c'-Al2O3 film on Ni3Al(111)
- Source :
- Surface Science; 1999, Vol. 442 Issue: 3 p385-399, 15p
- Publication Year :
- 1999
Details
- Language :
- English
- ISSN :
- 00396028
- Volume :
- 442
- Issue :
- 3
- Database :
- Supplemental Index
- Journal :
- Surface Science
- Publication Type :
- Periodical
- Accession number :
- ejs2727061
- Full Text :
- https://doi.org/10.1016/S0039-6028(99)00951-6